X-ray photoelectron spectroscopy (XPS) is a very surface sensitive (top ~10nm) analysis technique that measures the elemental composition and chemical state of a material using the feedback from an induced photoelectron effect. It is sometimes known by the alternative name Electron Spectroscopy for Chemical Analysis (ESCA).
-
, Edney, M., Lamb, J., Spanu, M., Smith, E., Steer, E., Wilmot, E., Reid, J., Barker, J., Alexander, M., Snape, C. & Scurr, D., ACS Applied Materials & Interfaces, 12, 51026–51035 (2020).
-
, Hu, Q., Sun, X.-Z., Parmenter, C. D. J., Fay, M. W., Smith, E. F., Rance, G. A., He, Y., Zhang, F., Liu, Y., Irvine, D., Tuck, C., Hague, R. & Wildman, R., Scientific Reports, 7, 17150 (2017).
-
, Korolkov, V. v, Timokhin, I. G., Haubrichs, R., Smith, E. F., Yang, L., Yang, S., Champness, N. R., Schröder, M. & Beton, P. H., Nature Communications, 8, 1385 (2017).
-
, J., Maxwell-Hogg, S., Smith, E. F., Hawker, R. R., Harper, J. B. & Licence, P., Physical Chemistry Chemical Physics, 21, 114–123 (2019).
-
, Belfield, K., Chen, X., Smith, E. F., Ashraf, W. & Bayston, R., Acta Biomaterialia, 90, 157–168 (2019).
-
, Qadir, M. I., Zanatta, M., Pinto, J., Vicente, I., Gual, A., Smith, E. F., Neto, B. A. D., de Souza, P. E. N., Khan, S., Dupont, J. & Alves Fernandes, J., ChemSusChem, 13, 5580–5585 (2020).
-
, Howard, F. N., Al-Janabi, H., Patel, P., Cox, K., Smith, E., Vadakekolathu, J., Pockley, A. G., Conner, J., Nohl, J. F., Allwood, D. A., Collado-Rojas, C., Kennerley, A., Staniland, S. & Muthana, M., Small, 18, 2104763 (2022).