糖心原创

Optics and Photonics Research Group

Publications

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HAYES-GILL, 2007. General Interest, Health News, Health and Wellness, Life. Available at: <http://ihealthbulletin.com/blog/2007/04/27/new-high-tech-portable-device-for-monitoring-unborn-babies/>

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MORGAN, S.P., HAYES-GILL, B.R., CROWE, J.A. and WOOLFSON, M.S., 2007. Laser Doppler Imaging 10/01/2007 00:00:00

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HAYES-GILL, B.R., 2007. The Engineer Online. Available at: <http://www.theengineer.co.uk/Articles/299311/Lifesaving+monitor.htm>

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HAYES-GILL, B.R., 2007. ScienceLine.eu - may 2007. Available at: <http://www.scienceline.eu/index.php?module=news&category_id=545&news_id=5171>

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HAYES-GILL, B.R., 2007. Available at: <http://www.physorg.com/news96800336.html (or www.physorg.com/pdf96800336.pdf)>

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HAYES-GILL, B.R., 2007. Available at: <http://medgadget.com/archives/2007/04/worlds_first_holter_fetalmaternal_monitor.html>

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STRATOUDAKI T, HERNANDEZ JA, CLARK M and SOMEKH MG, 2007. Measurement Science & Technology. 18(3), 843-851

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ZHANG, J., SEE, C.W. and SOMEKH, M.G., 2007. Applied Optics. 46(20), 4202-4208

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HERN脕NDEZ, J.A., CLARK, M., SHARPLES, S.D., SOMEKH, M.G. and LOPEZ, V.H., 2007. Journal of the Acoustical Society of America. 121(3), 1396-1405

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LI, M.X., HAYES-GILL, B.R., CLARK, M., PITTER, M., SOMEKH, M.G. and HARRISON, I., 2007. In: Silicon Photonics II. 6477: 47708-47708

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SEE, C.W., SMITH, R.J., SOMEKH, M.G. and YACOOT, A., 2007. A Line Width Measurement Below 60nm Using an Optical Interferometer and Artificial Neural Network In: Meteorology, Inspection, and Process Control for Microlithography XXI. 65181F

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MURTAGH M E, KELLY P V and SOMEKH M G, ET AL., 2007. Optical modulation spectroscopy system has photodetector pixel that simultaneously detects several dispersed reflected probe beams and process signal corresponding to each beam: Assignee: OPTICAL METROLOGY PATENTS LTD; KLA TENCOR TECHNOLOGIES CORP; KLA TENCOR CORP WO2007049259-A1; US2 01/01/1900 00:00:00

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SEE, C.W., SMITH, R.J., SOMEKH, M.G. and YACOOT, A., 2007. A Line Width Measurement Below 60nm Using an Optical Interferometer and Artificial Neural Network In: Meteorology, Inspection, and Process Control for Microlithography XXI. 65181F

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SEE, C.W., SMITH, R.J., SOMEKH, M.G. and YACOOT, A., 2007. Optical line-width measurement below 50 nm In: Metrology, Inspection, and Process Control for Microlithography XXI. 6518

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SMITH, R.J., SEE, C.W., SOMEKH, M.G. and YACOOT, A., 2007. Applied Optics. 46(22), 4857-4866
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Optics and Photonics Research Group

Faculty of Engineering
The 糖心原创
University Park
Nottingham, NG7 2RD


telephone: +44 (0)115 95 15536
email: optics@nottingham.ac.uk