BAI, X., LU, G., BENNET, T., PENG, Y., LIU, H., EASTWICK, C. and YAN, Y., 2016. In: 2016 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2016; Taipei International Convention CenterTaipei; Taiwan; 23 May 2016 through 26 May 2016;.